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Coretec is equipped
with an exceptional range of tools for chemical, electrical, materials
science and mechanical analyses and investigations. The three
manufacturing locations (Cleveland, Denver and Toronto) have a series of
specific tools in-house as well as access to shared devices that are
predominantly located in the Company’s Toronto laboratories. The
following is a sampling of the tools that are ensuring that your PCBs
are manufactured in accordance with the appropriate process controls and
specified standards.
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Atomic Absorption Spectrometer (AA)
Manufacturer – Perkin-Elmer AAAnalyst 200
Description – Atomic absorption spectrometry (AAS) is an analytical technique that measures the concentrations of elements. Atomic absorption is so sensitive that it can measure down to parts per billion of a gram (µg dm–3) in a sample. The technique makes use of the wavelengths of light specifically absorbed by an element. They correspond to the energies needed to promote electrons from one energy level to another, higher, energy level.
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CAT bench top probe system
Manufacturer – Conductor Analysis Technology Inc.
Description – This system provides a standardized method to measure, track, and improve PCB manufacturing process capability and quality. Results from the analysis of CAT test patterns and coupons provide quantitative yield and uniformity data that illustrate strengths and weaknesses of processes, and point to areas requiring improvement or development. Furthermore, the data offers insight into the sources of defects and process non-uniformities, allowing for their reduction or elimination. Configured for the following test patterns and coupons:IPC PCQR˛ Revision D designsCAT Conductor and space designsHATS coupons
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Coordinate Measuring Machine (CMM)
Manufacturer – OPTEK 713V
Description – A CMM is an NC machine that uses a measuring probe to obtain the coordinates of points on an object surface. These machines are used to measure the dimensions of target objects to tolerances as small as .0001". The machine uses an X-Y-Z grid to determine its position on a worktable. A probe is used to touch different spots on the part being measured. The machine then uses the X,Y,Z coordinates of each of these points to determine size and position.
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Differential Scanning Calorimeter (DSC)
Manufacturer – Perkin-Elmer DSC7
Description – a DSC is a tool that is used to measure the glass transition temperature of a polymer as well as the changes that occur to a polymer when it is heated.
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Dynamic Mechanical Analyzer (DMA)
Manufacturer – Perkin-Elmer DMA7 with TAC
Description – DMA measures the mechanical properties of materials as a function of time, temperature, and frequency.
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Hi-Pot tester
Manufacturer – Associated Research Inc. Model 3665
Description – Hi-pot" is short for high potential (high voltage). A hi-pot test takes two circuits that should be isolated and applies a very high voltage between them. The current that flows is measured. If the circuits are not well isolated current will flow between them and fail the test.
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Interconnect Stress Testers (IST)
Manufacturer – PWB Interconnect Solutions Inc.
Description – an outstanding in-process and product specific tool for testing plated hole reliability on a predetermined coupon/sample. IST is renowned and accepted by electronic equipment manufacturers who are committed to high reliability/Class 3 requirements. Coretec’s Toronto operations house two units that perform product and in-process IST analysis for all sites.
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Ionograph (aka Omegameter)
Manufacturer – Alphametals Inc. Ionograph 500MI
Description – An Omegameter uses the "static test" methodology to perform cleanliness testing on printed circuit boards and assemblies. This unit operates with a heated, agitated extract solution that removes and measures accurately contamination resulting from process residues in both board fabrication and board assembly processes.
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Metallograph with CCD camera
Manufacturer – Leco 300
Description – this microscope offers 25-1000X magnification. It is outfitted with a large viewing screen as well as conventional stereo zoom eye-pieces. A colour camera and computer attachment allow digital image transmission.
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Metallurgical microscope with CCD camera
Manufacturer – Zeiss STEMI SV6
Description – this metallurgical scope offers 25-1000X magnification and is outfitted with a colour camera and monitor for viewing and image storage. This unit has an inverted, adjustable table that allows for fine x-y axis manipulation of the sample or coupon being viewed.
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Micro-section preparation equipment
Manufacturer – Buehler
Description – multiple section making apparatus’ are required to facilitate in-process, final QA and failure analysis cross-sections. Coupon saws, epoxy potting molds, grinders and polishers (both manual and automated) are utilized to generate micro-section samples for analysis under magnification.
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Peel Strength Tester
Manufacturer – Chantillon LTCM100
Description – Peel strength is generally used to measure the adhesive bond strength of a material, typically and adhesive. Peel strength is the average load per unit width of bond line required to separate bonded materials where the angle of separation is 180-degrees.
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Scanning Electron Microscope (SEM)
Manufacturer – Hitachi S-2400
Description – A SEM is a microscope that uses electrons rather than light to form an image. The SEM has a large depth of field, which allows a large amount of the sample to be in focus at one time. The SEM also produces images of high resolution, which means that closely spaced features can be examined at a high magnification (up to 250,000X). Preparation of the samples is relatively easy since most SEMs only require the sample to be conductive.
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Stereo microscope with CCD camera
Manufacturer – Navitar Optiplex GX620
Description – this stereo zoom microscope has a 8-50X magnification range and is outfitted with a colour camera and monitor for viewing and image storage.
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Time Domain Reflectometer (TDR)
Manufacturer – Polar Instruments CITS 500
Description – Time-domain reflectometry or TDR is a measurement technique used to determine the characteristics of electrical lines by observing reflected waveforms. The amplitude of the reflected signal can be determined from the impedance of the discontinuity. The distance to the reflecting impedance can also be determined from the time that a pulse takes to return.
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Vacuum sputtering/etching unit
Manufacturer – Technics Inc.
Description – this unit sputters a coating of gold onto a sample that is to be subsequently analyzed using a scanning electron microscope.
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X-ray
Manufacturer – CR Technology Inc. CRX1000
Description – Real time x-ray analysis is critical for failure analysis, in- process verification and raw material inspection. The z-axis adjustment capability facilitates layer assessment regardless of layer count and overall part thickness. This device has a 14”x12” travel which accommodates most form factors. Image magnification is up to 35X.
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X-ray Fluorescence Spectrometer (XRF)
Manufacturer – Oxford Instruments CMI900
Description – X-ray Fluorescence (XRF) instruments work by exposing a sample to be measured to a beam of X-rays. The atoms of the sample absorb energy from the X-rays, become temporarily excited and then emit secondary X-rays. Each chemical element emits at a unique energy. By measuring the intensity and characteristic energy of the emitted X-rays, an XRF analyzer can provide qualitative and quantitative analysis regarding the composition of the material being tested.
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